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Compensation of Interconnect Line Degradations by Negative Group Delay Active Circuit

Blaise Elysée Guy Ravelo 1 André Pérennec 1 Marc Le Roy 1, * 
* Corresponding author
Lab-STICC - Laboratoire des sciences et techniques de l'information, de la communication et de la connaissance, UBO - Université de Brest
Abstract : Nowadays, because of the continuous technological progress in the very deep-submicron area, the overall circuit performance is dominated by interconnect delay. So, the interconnect line propagation delay can no longer be neglected. The most popular among the theoretical models available in the literature to assess the effects of these lines has been proposed by Elmore in 1948. We recently developed an active circuit able to produce negative group delay (NGD) and gain at first in the microwave domain, and secondly dedicated to base band signals. Thanks to this new concept, we proposed an innovative technique to reduce interconnect effects.
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Submitted on : Tuesday, June 15, 2010 - 6:14:08 PM
Last modification on : Monday, March 14, 2022 - 11:08:11 AM


  • HAL Id : hal-00492427, version 1


Blaise Elysée Guy Ravelo, André Pérennec, Marc Le Roy. Compensation of Interconnect Line Degradations by Negative Group Delay Active Circuit. 8th International Conference Interconnection Technology of Electronic Board, May 2008, Brest, France. ⟨hal-00492427⟩



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