Compensation of Interconnect Line Degradations by Negative Group Delay Active Circuit - Université de Bretagne Occidentale
Conference Papers Year : 2008

Compensation of Interconnect Line Degradations by Negative Group Delay Active Circuit

Blaise Elysée Guy Ravelo
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André Pérennec
Marc Le Roy
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Abstract

Nowadays, because of the continuous technological progress in the very deep-submicron area, the overall circuit performance is dominated by interconnect delay. So, the interconnect line propagation delay can no longer be neglected. The most popular among the theoretical models available in the literature to assess the effects of these lines has been proposed by Elmore in 1948. We recently developed an active circuit able to produce negative group delay (NGD) and gain at first in the microwave domain, and secondly dedicated to base band signals. Thanks to this new concept, we proposed an innovative technique to reduce interconnect effects.

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Electronics
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Dates and versions

hal-00492427 , version 1 (15-06-2010)

Identifiers

  • HAL Id : hal-00492427 , version 1

Cite

Blaise Elysée Guy Ravelo, André Pérennec, Marc Le Roy. Compensation of Interconnect Line Degradations by Negative Group Delay Active Circuit. 8th International Conference Interconnection Technology of Electronic Board, May 2008, Brest, France. ⟨hal-00492427⟩
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