Swept-wavelength null polarimetry for highly sensitive birefringence laser scanning microscopy - Université de Bretagne Occidentale
Article Dans Une Revue Optics Letters Année : 2024

Swept-wavelength null polarimetry for highly sensitive birefringence laser scanning microscopy

Résumé

We have recently demonstrated a high-speed null polarimeter [ Opt. Express 30 , 18889 ( 2022 ) 10.1364/OE.454193 OPEXFF 1094-4087 ] based on passive polarization optics and using a fast swept-wavelength laser source. We report here its implementation in a laser-scanning microscope setup, enabling highly sensitive linear retardance imaging with a pixel dwell time of 10 μ s. The instrument is also able to measure light depolarization induced by the sample. Images of biological samples, including cancerous tissue and cells, illustrate its performances.
Fichier non déposé

Dates et versions

hal-04716975 , version 1 (01-10-2024)

Identifiants

Citer

Xavier Theillier, Sylvain Rivet, Matthieu Dubreuil, Yann Le Grand. Swept-wavelength null polarimetry for highly sensitive birefringence laser scanning microscopy. Optics Letters, 2024, 49 (2), pp.387. ⟨10.1364/OL.507576⟩. ⟨hal-04716975⟩
7 Consultations
0 Téléchargements

Altmetric

Partager

More