Swept-wavelength null polarimetry for highly sensitive birefringence laser scanning microscopy - Université de Bretagne Occidentale
Journal Articles Optics Letters Year : 2024

Swept-wavelength null polarimetry for highly sensitive birefringence laser scanning microscopy

Abstract

We have recently demonstrated a high-speed null polarimeter [ Opt. Express 30 , 18889 ( 2022 ) 10.1364/OE.454193 OPEXFF 1094-4087 ] based on passive polarization optics and using a fast swept-wavelength laser source. We report here its implementation in a laser-scanning microscope setup, enabling highly sensitive linear retardance imaging with a pixel dwell time of 10 μ s. The instrument is also able to measure light depolarization induced by the sample. Images of biological samples, including cancerous tissue and cells, illustrate its performances.
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Dates and versions

hal-04716975 , version 1 (01-10-2024)

Identifiers

Cite

Xavier Theillier, Sylvain Rivet, Matthieu Dubreuil, Yann Le Grand. Swept-wavelength null polarimetry for highly sensitive birefringence laser scanning microscopy. Optics Letters, 2024, 49 (2), pp.387. ⟨10.1364/OL.507576⟩. ⟨hal-04716975⟩
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