Efficient minimization of test frequencies for linear analog circuits - Université de Bretagne Occidentale
Conference Papers Year : 2013

Efficient minimization of test frequencies for linear analog circuits

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Micro and nanotechnologies/Microelectronics

Ahcène Bounceur  : Connect in order to contact the contributor

https://hal.univ-brest.fr/hal-00789857

Submitted on : Monday, February 18, 2013-11:16:50 PM

Last modification on : Tuesday, August 27, 2024-12:43:53 PM

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hal-00789857 , version 1 (18-02-2013)

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  • HAL Id : hal-00789857 , version 1

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Mohand Bentobache, Ahcène Bounceur, Reinhardt Euler, Yann Kieffer, Salvador Mir. Efficient minimization of test frequencies for linear analog circuits. 18th IEEE European Test Symposium (ETS), May 2013, Avignon, France. ⟨hal-00789857⟩

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