Pseudorandom Functional BIST for Linear and Nonlinear MEMS - Université de Bretagne Occidentale Access content directly
Conference Papers Year : 2006

Pseudorandom Functional BIST for Linear and Nonlinear MEMS


Pseudorandom test techniques are widely used for measuring the impulse response (IR) for linear devices and Volterra kernels for nonlinear devices, especially in the acoustics domain. This paper studies the application of pseudorandom functional test techniques to linear and nonlinear MEMS Built-In-Self-Test (BIST). We will first present the classical pseudorandom BIST technique for Linear Time Invariant (LTI) systems which is based on the evaluation of the IR of the Device Under Test (DUT) stimulated by a Maximal Length Sequence (MLS). Then we will introduce a new type of pseudorandom stimuli called the Inverse-Repeat Sequence (IRS) that proves better immunity to noise and distortion than MLS. Next, we will illustrate the application of these techniques for weakly nonlinear, purely nonlinear and strongly nonlinear devices.


No file

Dates and versions

hal-00522093 , version 1 (29-09-2010)


  • HAL Id : hal-00522093 , version 1


A. Dhayni, Salvador Mir, Libor Rufer, Ahcène Bounceur. Pseudorandom Functional BIST for Linear and Nonlinear MEMS. Design, Automation and Test in Europe, Sep 2006, Germany. pp.0. ⟨hal-00522093⟩
124 View
0 Download


Gmail Facebook X LinkedIn More