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Interférence entre lignes signals en technologie silicium submicronique

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https://hal.univ-brest.fr/hal-00488156
Contributor : Noël Tanguy Connect in order to contact the contributor
Submitted on : Tuesday, June 1, 2010 - 11:57:49 AM
Last modification on : Monday, October 11, 2021 - 2:22:31 PM

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  • HAL Id : hal-00488156, version 1
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Thierry Le Gouguec, Noël Tanguy, Fabrice Huret, Jean Chilo. Interférence entre lignes signals en technologie silicium submicronique. 11e Colloque International de Compatibilité Electromagnétique, CEM 2002, Mar 2002, Grenoble, France. pp.421-426. ⟨hal-00488156⟩

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