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Interférence entre lignes signals en technologie silicium submicronique

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https://hal.univ-brest.fr/hal-00488156
Contributor : Noël Tanguy <>
Submitted on : Tuesday, June 1, 2010 - 11:57:49 AM
Last modification on : Wednesday, June 24, 2020 - 4:18:37 PM

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  • HAL Id : hal-00488156, version 1

Citation

Thierry Le Gouguec, Noël Tanguy, Fabrice Huret, Jean Chilo. Interférence entre lignes signals en technologie silicium submicronique. 11e Colloque International de Compatibilité Electromagnétique, CEM 2002, Mar 2002, Grenoble, France. pp.421-426. ⟨hal-00488156⟩

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