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KTa0.6Nb0.4O3 Ferroelectric Thin Film Behavior at Microwave Frequencies for Tunable Applications

Abstract : In this study about the relationships between structural and microwave electrical properties of KTa1-xNbxO3 (KTN) ferroelectric materials, a KTN thin film was deposited on different substrates to investigate how KTN growth affects the microwave behavior. Interdigital capacitors and stubs were made on these films through a simple engraving process. Microwave measurements under a static electric field showed the importance of the substrate on the circuit behavior and, notably, on the tuning factor.
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https://hal.univ-brest.fr/hal-00459192
Contributor : Vincent Laur <>
Submitted on : Tuesday, February 23, 2010 - 4:46:28 PM
Last modification on : Friday, July 10, 2020 - 4:15:02 PM
Long-term archiving on: : Friday, June 18, 2010 - 6:27:12 PM

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Vincent Laur, Anthony Rousseau, Gérard Tanné, Paul Laurent, Stéphanie Députier, et al.. KTa0.6Nb0.4O3 Ferroelectric Thin Film Behavior at Microwave Frequencies for Tunable Applications. IEEE Transactions on Ultrasonics, Ferroelectrics and Frequency Control, Institute of Electrical and Electronics Engineers, 2006, 53 (12), pp.2280-2286. ⟨10.1109/TUFFC.2006.174⟩. ⟨hal-00459192⟩

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