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Mots clés
6855Jk
NRP
17O
Pb centers
Low energy electron diffraction LEED
Channeling
PIXE
Silicon
Oxygen deficiency
GaMnAs
Gold
Metal-insulator transition
X-ray diffraction
RBS
Isotopic Tracing
Defects
AC susceptibility
Silica
EPR
Multilayer
Alloys
Oxidation
Growth
27Ald p&α
Topological defects
Auger electron spectroscopy AES
Indium oxide
Nuclear reaction analysis
8140Ef
Aluminium
Charge exchange
Adsorption
Magnetization curves
Nickel
3C-SiC
HfO2
Annealing
Epitaxial growth
Ferromagnetic resonance
Periodic multilayer
Energy loss
Evaluation
ALD
15N
Photoluminescence
Adsorption Isotherms
Thin films
7550Pp
Acoustic
Gallium oxide
Diffusion
Nitridation
Topological insulators
Raman spectroscopy
2H
Aluminum
Nuclear resonance profiling NRP
Interface defects
Adsorbed layers
Ageing
Silicon Carbide
Epitaxy
XPS
XRD
Passivation
Magnetic anisotropy
Measurement
18O
Silicon carbide
Thin film
Magnetic semiconductors
Transparent conductive oxide TCO
Density functional theory
Hysteresis
Kossel diffraction
Acoustic propreties of solid
27Aldp
Ion implantation
7550Ee
Nanostructures
27Alda
Atomic Layer Deposition ALD
Rutherford backscattering spectrometry RBS
Nanoparticles
7630Lh
Ion beam analysis
Sputtering
ADSORPTION DESORPTION HYSTERESIS
Pulsed laser deposition
SiC
13C
17Opp
Al2O3
Capillary condensation
Stable isotopic tracing
18O resonance
Zinc oxide
Alloy
AFM
17Op