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Conference papers
New techniques for selecting test frequencies for linear analog circuits
Abstract : In this paper we show that the problem of minimizing the number of test frequencies necessary to detect all possible faults in a multi-frequency test approach for linear analog circuits can be modeled as a set covering problem. We will show in particular, that under some conditions on the considered faults, the coefficient matrix of the problem has the strong consecutive-ones property and hence the corresponding set covering problem can be solved in polynomial time. For an efficient solution of the problem, an interval graph formulation is also used and a polynomial algorithm using the interval graph structure is suggested. The optimization of test frequencies for a case-study biquadratic filter is presented for illustration purposes. Numerical simulations with a set of randomly generated problem instances demonstrate two different implementation approaches to solve the optimization problem very fast, with a good time complexity.
Cited literature [18 references]
https://hal.univ-brest.fr/hal-00855154
Contributor : Ahcène Bounceur Connect in order to contact the contributor
Submitted on : Thursday, August 29, 2013 - 6:53:22 AM
Last modification on : Monday, October 11, 2021 - 2:23:11 PM
Long-term archiving on: : Monday, December 2, 2013 - 8:53:25 AM
Contributor : Ahcène Bounceur Connect in order to contact the contributor
Submitted on : Thursday, August 29, 2013 - 6:53:22 AM
Last modification on : Monday, October 11, 2021 - 2:23:11 PM
Long-term archiving on: : Monday, December 2, 2013 - 8:53:25 AM
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VLSI-SOC2013-FinalVersion1.pdf
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