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New techniques for selecting test frequencies for linear analog circuits

Mohand Bentobache 1, 2, * Ahcène Bounceur 3 Reinhardt Euler 3 Yann Kieffer 4 Salvador Mir 5 
* Corresponding author
Lab-STICC - Laboratoire des sciences et techniques de l'information, de la communication et de la connaissance, UBO - Université de Brest
4 G-SCOP_ROSP - Recherche Opérationnelle pour les Systèmes de Production
G-SCOP - Laboratoire des sciences pour la conception, l'optimisation et la production
Abstract : In this paper we show that the problem of minimizing the number of test frequencies necessary to detect all possible faults in a multi-frequency test approach for linear analog circuits can be modeled as a set covering problem. We will show in particular, that under some conditions on the considered faults, the coefficient matrix of the problem has the strong consecutive-ones property and hence the corresponding set covering problem can be solved in polynomial time. For an efficient solution of the problem, an interval graph formulation is also used and a polynomial algorithm using the interval graph structure is suggested. The optimization of test frequencies for a case-study biquadratic filter is presented for illustration purposes. Numerical simulations with a set of randomly generated problem instances demonstrate two different implementation approaches to solve the optimization problem very fast, with a good time complexity.
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Submitted on : Thursday, August 29, 2013 - 6:53:22 AM
Last modification on : Monday, March 14, 2022 - 11:08:08 AM
Long-term archiving on: : Monday, December 2, 2013 - 8:53:25 AM


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  • HAL Id : hal-00855154, version 1


Mohand Bentobache, Ahcène Bounceur, Reinhardt Euler, Yann Kieffer, Salvador Mir. New techniques for selecting test frequencies for linear analog circuits. International Conference on Very Large Scale Integration (VLSI-SoC), Oct 2013, Istamboul, Turkey. ⟨hal-00855154⟩



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