P. Queffelec and M. , Broad-band characterization of magnetic and dielectric thin films using a microstrip line, IEEE Transactions on Instrumentation and Measurement, vol.47, issue.4, pp.956-963, 1998.
DOI : 10.1109/19.744649

C. M. Krowne, M. Daniel, S. W. Kirchoefer, and J. M. Pond, Anisotropic permittivity and attenuation extraction from propagation constant measurements using an anisotropic full-wave Green's function solver for coplanar ferroelectric thin-film devices, IEEE Transactions on Microwave Theory and Techniques, vol.50, issue.2, pp.2-537, 2002.
DOI : 10.1109/22.982233

H. Lue and T. Tseng, Application of On-Wafer TRL Calibration on the Measurement of Microwave Properties of Ba 0.5 Sr 0, IEEE Transactions on Ultrasonics, Ferroelectrics, And Frequency Control, vol.48, pp.61640-1647, 2001.

M. D. Janezic and D. F. Williams, Permittivity characterization of low-k thin films from transmission-line measurements, IEEE Transactions on Microwave Theory and Techniques, vol.51, issue.1, p.1, 2003.
DOI : 10.1109/TMTT.2002.806925

C. Holloway and E. F. Kuester, « A Quasi-closed Form Expression for the Conductor Loss of CPW Lines, IEEE Transactions on Microwave Theory and Techniques, vol.43, pp.12-2695, 1995.