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On-chip pseudorandom testing for linear and nonlinear MEMS

Abstract : In this paper we study the use of pseudorandom test techniques for linear and nonlinear devices, in particular MEMS. These test techniques lead to practical Built-In-Self-Test techniques (BIST). We will first present the pseudorandom test technique for Linear Time Invariant (LTI) systems. Next, we will illustrate and evaluate the application of these techniques for weakly nonlinear, purely nonlinear and strongly nonlinear devices.
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Contributor : Ahcène Bounceur <>
Submitted on : Wednesday, September 29, 2010 - 4:33:43 PM
Last modification on : Friday, December 11, 2020 - 8:28:04 AM


  • HAL Id : hal-00522104, version 1



A. Dhayni, Salvador Mir, L. Rufer, Ahcène Bounceur. On-chip pseudorandom testing for linear and nonlinear MEMS. VLSI-SoC, Oct 2005, Australia. pp.245-266. ⟨hal-00522104⟩



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