Abstract : In this paper we study the use of pseudorandom test techniques for linear and nonlinear devices, in particular MEMS. These test techniques lead to practical Built-In-Self-Test techniques (BIST). We will first present the pseudorandom test technique for Linear Time Invariant (LTI) systems. Next, we will illustrate and evaluate the application of these techniques for weakly nonlinear, purely nonlinear and strongly nonlinear devices.
http://hal.univ-brest.fr/hal-00522104
Contributeur : Ahcène Bounceur
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Soumis le : mercredi 29 septembre 2010 - 16:33:43
Dernière modification le : mercredi 16 mai 2018 - 18:30:04
A. Dhayni, Salvador Mir, L. Rufer, A. Bounceur. On-chip pseudorandom testing for linear and nonlinear MEMS. VLSI-SoC, Oct 2005, Australia. pp.245-266, 2005. 〈hal-00522104〉
