A SNDR BIST for SigmaDelta Analogue-to-Digital Converters

Abstract : The test of high resolution Sigma-Delta Analogueto- Digital Converters (SigmaDelta ADCs) is a costly task due to its high resolution and the large number of samples required. In this paper, we propose a Built-In Self-Test (BIST) technique for the test of SNDR (Signal-to-Noise plus Distortion Ratio) in SigmaDelta ADCs. The technique, mostly digital, uses a binary stream as test stimulus and carries out a sine-wave fitting algorithm to analyse the output response. Both the test signal generation and the output response analysis are performed on-chip, taking advantage of the digital resources already present in a SigmaDelta ADC. Simulations results show the capability of this technique to obtain measures of the SNDR for a 16-bit audio SigmaDelta ADC.
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Communication dans un congrès
VLSI Test Symposium, Apr 2006, United States. pp.0, 2006
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http://hal.univ-brest.fr/hal-00522095
Contributeur : Ahcène Bounceur <>
Soumis le : mercredi 29 septembre 2010 - 16:22:54
Dernière modification le : jeudi 11 janvier 2018 - 06:15:43

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  • HAL Id : hal-00522095, version 1

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L. Rolindez, Salvador Mir, A. Bounceur, J.L. Carbonero. A SNDR BIST for SigmaDelta Analogue-to-Digital Converters. VLSI Test Symposium, Apr 2006, United States. pp.0, 2006. 〈hal-00522095〉

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