On the accurate estimation of test metrics for multiple analogue parametric deviations

Abstract : The estimation of test metrics such as defect level, test yield or yield loss is important in order to quantify the quality and cost of a test approach. In the analogue domain, previous works have considered the estimation of these metrics for the case of single faults, either catastrophic or parametric. The consideration of single parametric faults is sensible for a production test technique if the design is robust. However, in the case that production test limits are tight, test escapes resulting from multiple parametric deviations become important. In addition, aging mechanisms result in field failures that are often caused by multiple parametric deviations. In this paper, we present a statistical technique for estimating test metrics for the case of multiple analogue parametric deviations, requiring a Monte Carlo simulation of the circuit under test. This technique assumes Gaussian Probability Density Functions (PDFs) for the parameter and performance deviations. We will illustrate the technique for the case of testing a fully differential operational amplifier, proving the validity in the case of this circuit of the Gaussian PDF.
Keywords : mixed-signal test
Type de document :
Communication dans un congrès
12th International Mixed-Signals Testing Workshop (IMSTW'06), May 2006, United Kingdom. pp.0, 2006
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http://hal.univ-brest.fr/hal-00522023
Contributeur : Ahcène Bounceur <>
Soumis le : mercredi 29 septembre 2010 - 13:20:25
Dernière modification le : mercredi 16 mai 2018 - 18:30:04

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  • HAL Id : hal-00522023, version 1

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A. Bounceur, Salvador Mir, L. Rolindez, Emmanuel Simeu. On the accurate estimation of test metrics for multiple analogue parametric deviations. 12th International Mixed-Signals Testing Workshop (IMSTW'06), May 2006, United Kingdom. pp.0, 2006. 〈hal-00522023〉

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