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Conference papers

Evaluation of test measures for low-cost LNA production testing

J. Tongbong 1 Ahcène Bounceur 1 Salvador Mir 1 J.L. Carbonero 2
1 TIMA - Techniques de l'Informatique et de la Microélectronique pour l'Architecture des systèmes intégrés
2 ST-CROLLES - STMicroelectronics [Crolles]
keyword : test
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https://hal.univ-brest.fr/hal-00522018
Contributor : Ahcène Bounceur Connect in order to contact the contributor
Submitted on : Wednesday, September 29, 2010 - 1:09:28 PM
Last modification on : Tuesday, January 26, 2021 - 8:56:02 AM

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  • HAL Id : hal-00522018, version 1

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J. Tongbong, Ahcène Bounceur, Salvador Mir, J.L. Carbonero. Evaluation of test measures for low-cost LNA production testing. PhD Forum at 14th IFIP International Conference on Very Large Scale Integraation (VLSI-SoC'06), May 2006, France. pp.0. ⟨hal-00522018⟩

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