Evaluation of test measures for low-cost LNA production testing

J. Tongbong 1 A. Bounceur 1 Salvador Mir 1 J.L. Carbonero 2
1 TIMA - Techniques of Informatics and Microelectronics for integrated systems Architecture
2 ST-CROLLES - STMicroelectronics [Crolles]
keyword : test
Type de document :
Communication dans un congrès
PhD Forum at 14th IFIP International Conference on Very Large Scale Integraation (VLSI-SoC'06), May 2006, France. pp.0, 2006
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http://hal.univ-brest.fr/hal-00522018
Contributeur : Ahcène Bounceur <>
Soumis le : mercredi 29 septembre 2010 - 13:09:28
Dernière modification le : mercredi 16 mai 2018 - 18:30:04

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  • HAL Id : hal-00522018, version 1

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J. Tongbong, A. Bounceur, Salvador Mir, J.L. Carbonero. Evaluation of test measures for low-cost LNA production testing. PhD Forum at 14th IFIP International Conference on Very Large Scale Integraation (VLSI-SoC'06), May 2006, France. pp.0, 2006. 〈hal-00522018〉

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