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Conference Papers Year : 2006

Evaluation of test measures for low-cost LNA production testing

Keywords

test

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Micro and nanotechnologies/Microelectronics

Ahcène Bounceur  : Connect in order to contact the contributor

https://hal.univ-brest.fr/hal-00522018

Submitted on : Wednesday, September 29, 2010-1:09:28 PM

Last modification on : Friday, March 24, 2023-2:52:53 PM

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hal-00522018 , version 1 (29-09-2010)

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  • HAL Id : hal-00522018 , version 1

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J. Tongbong, Ahcène Bounceur, Salvador Mir, J.L. Carbonero. Evaluation of test measures for low-cost LNA production testing. PhD Forum at 14th IFIP International Conference on Very Large Scale Integraation (VLSI-SoC'06), May 2006, France. pp.0. ⟨hal-00522018⟩

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