Skip to Main content Skip to Navigation
Conference papers

KTN dielectric properties at microwave frequencies: substrate influence

Vincent Laur 1 Gérard Tanné 1 Paul Laurent 1 Fabrice Huret 1 Anthony Rousseau 2 Valérie Bouquet 2 Maryline Guilloux-Viry 2
1 Lab-STICC - Laboratoire des sciences et techniques de l'information, de la communication et de la connaissance (UMR 3192)
2 ISCR - Institut des Sciences Chimiques de Rennes
Abstract : To determine the dielectric properties of ferroelectric thin-films over a wide range of frequencies we developed a simple and efficient method based on the measurement of coplanar waveguide realized on ferroelectric/dielectric heterostructures by using a Spectral Domain Approach. We applied this method to KTa1−xNbxO3 (KTN) thinfilms deposited on different substrates. The strong differences observed in the dielectric behavior of KTNs according to the growth substrate suggest that it is affected not only via the resulting microstructure, but also by the induced strains. Accuracy of the method was estimated to 15 and 10% on permittivity and loss tangent, respectively.
Document type :
Conference papers
Complete list of metadatas
https://hal.univ-brest.fr/hal-00484658
Contributor : Vincent Laur <>
Submitted on : Tuesday, May 18, 2010 - 5:40:26 PM
Last modification on : Wednesday, August 5, 2020 - 3:45:53 AM

Identifiers

  • HAL Id : hal-00484658, version 1

Collections

CNRS | LAB-STICC_UBO | UNIV-BREST | UNIV-RENNES1 | ISCR | ISCR-CSM | LAB-STICC | INC-CNRS | UR1-UFR-SPM | UNIV-RENNES | INSA-GROUPE | INSTITUT-TELECOM | INSA-RENNES | PSL

Citation

Vincent Laur, Gérard Tanné, Paul Laurent, Fabrice Huret, Anthony Rousseau, et al.. KTN dielectric properties at microwave frequencies: substrate influence. European Conference on Applications of Polar Dielectrics, Sep 2006, Metz, France. ⟨hal-00484658⟩

Export

BibTeX TEI DC DCterms EndNote

Share

Metrics

Record views

219