Test Logic testing Through-silicon vias MEMS Switches Computer architecture Low power Memories Circuit faults DPA Design space exploration Simulation VLSI Robustness Design Libraries Delays Protons Core-cell Radiation Registers Fault attacks Cross-section ATPG Electromagnetic Analysis Ring oscillators Delay testing Calibration Field programmable gate arrays Atmospheric neutrons Memory device Reliability Flip-flops Multiple cell upset MCU Fiabilité Logic gates Education CMOS integrated circuits CMOS Soft errors SEU MRAM Software Low-power design Fault tolerance Cryptographie AES Crosstalk Integrated circuit modeling BIST Soft Error Rate FPGA Single Event Upset Countermeasures Sensors Automatic test pattern generation Silicon Neutron Accelerometers Hardware Trojan Failure analysis DFT Magnetic tunneling Embedded systems Transient faults Neutrons Testing Integrated circuit interconnections Hardware Single event upset SEU Integrated circuit testing Random access memory Cryptography Diagnostic Accelerometer Transistors Modeling Integrated circuit design SoC Power demand Side-Channel Attacks Soft Errors Heavy ions Power consumption Clocks Memory test Heating Testability Thermal sensor Monitoring SER Variability Fault injection Fault modeling RSA Security Microprocessors SRAM Analytical models Cross section