Pseudorandom BIST for test and characterization of linear and nonlinear MEMS

Abstract : In this paper we study the use of the pseudorandom (PR) technique for test and characterization of linear and nonlinear devices, in particular for micro electro mechanical systems (MEMS). The PR test technique leads to a digital built-in-self-test (BIST) technique that is accurate in the presence of parametric variations, noise tolerant, and has high-quality test metrics. We will describe the use of the PR test technique for testing linear and nonlinear MEMS, where impulse response samples of the device under test are considered to verify its functionality. Next, we illustrate and evaluate the application of this technique for linear and nonlinear MEMS characterization.
keyword : test bist
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Article dans une revue
Microelectronics Journal, Elsevier, 2008, pp.1054-1061
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http://hal.univ-brest.fr/hal-00521972
Contributeur : Ahcène Bounceur <>
Soumis le : mercredi 29 septembre 2010 - 11:08:17
Dernière modification le : jeudi 11 janvier 2018 - 06:15:43

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  • HAL Id : hal-00521972, version 1

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A. Dhayni, Salvador Mir, L. Rufer, A. Bounceur, Emmanuel Simeu. Pseudorandom BIST for test and characterization of linear and nonlinear MEMS. Microelectronics Journal, Elsevier, 2008, pp.1054-1061. 〈hal-00521972〉

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